Εισάγετε μια λέξη ή φράση σε οποιαδήποτε γλώσσα 👆
Γλώσσα:
Μετάφραση και ανάλυση λέξεων από την τεχνητή νοημοσύνη ChatGPT
Σε αυτήν τη σελίδα μπορείτε να λάβετε μια λεπτομερή ανάλυση μιας λέξης ή μιας φράσης, η οποία δημιουργήθηκε χρησιμοποιώντας το ChatGPT, την καλύτερη τεχνολογία τεχνητής νοημοσύνης μέχρι σήμερα:
- πώς χρησιμοποιείται η λέξη
- συχνότητα χρήσης
- χρησιμοποιείται πιο συχνά στον προφορικό ή γραπτό λόγο
- επιλογές μετάφρασης λέξεων
- παραδείγματα χρήσης (πολλές φράσεις με μετάφραση)
- ετυμολογία
Τι (ποιος) είναι probe$64062$ - ορισμός
PROBE USED FOR ELECTRONIC TESTING
Test prod; Scope probe; Oscilloscope probe; Test lead; Differential probe; Near-field probe; Near field probe; Z0 probe; Zo probe; ZO probe; High voltage probe
Test probe
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
Kelvin probe force microscope
![The changes to the [[Fermi level]]s of the scanning Kelvin probe (SKP) sample and probe during measurement are shown. On electrical connection of the probe and sample their [[Fermi level]]s equilibrate, and a charge develops at the probe and sample. A backing potential is applied to null this charge, returning the sample Fermi level to its original position.](https://commons.wikimedia.org/wiki/Special:FilePath/SKP Fermi level diagram.png?width=200 "The changes to the [[Fermi level]]s of the scanning Kelvin probe (SKP) sample and probe during measurement are shown. On electrical connection of the probe and sample their [[Fermi level]]s equilibrate, and a charge develops at the probe and sample. A backing potential is applied to null this charge, returning the sample Fermi level to its original position.")
![A typical scanning Kelvin probe (SKP) instrument. On the left is the control unit with lock-in amplifier and backing potential controller. On the right is the x, y, z scanning axis with vibrator, [[electrometer]] and probe mounted.](https://commons.wikimedia.org/wiki/Special:FilePath/SKP Typical Instrument2.jpg?width=200 "A typical scanning Kelvin probe (SKP) instrument. On the left is the control unit with lock-in amplifier and backing potential controller. On the right is the x, y, z scanning axis with vibrator, [[electrometer]] and probe mounted.")
 Block Diagram.jpg?width=200 "Block diagram of a scanning Kelvin probe (SKP) instrument showing computer, control unit, scan axes, vibrator, probe and sample")
A NONCONTACT VARIANT OF ATOMIC FORCE MICROSCOPY
Kelvin Probe; Kelvin probe microscopy; Kelvin probe microscope; Kelvin probe force microscopy; Scanning Kelvin probe; Scanning kelvin probe; Scanning Kelvin Probe
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Interstellar probe
![pictorial message]] in case they are rediscovered](https://commons.wikimedia.org/wiki/Special:FilePath/Pioneer plaque.svg?width=200 "pictorial message]] in case they are rediscovered")
![The [[Voyager Golden Record]], as included aboard the ''Voyager 1'' and ''Voyager 2'' spacecraft, features audio recordings and encoded pictures](https://commons.wikimedia.org/wiki/Special:FilePath/The Sounds of Earth - GPN-2000-001976.jpg?width=200 "The [[Voyager Golden Record]], as included aboard the ''Voyager 1'' and ''Voyager 2'' spacecraft, features audio recordings and encoded pictures")
SPACE PROBE THAT CAN TRAVEL OUT OF THE SOLAR SYSTEM
Starprobe; Interstellar spaceprobe; Interstellar space probe
An interstellar probe is a space probe that has left—or is expected to leave—the Solar System and enter interstellar space, which is typically defined as the region beyond the heliopause. It also refers to probes capable of reaching other star systems.
Βικιπαίδεια
Test probe
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes. A test probe is often supplied as a test lead, which includes the probe, cable and terminating connector.
